A practical look at ATPG
نویسنده
چکیده
منابع مشابه
Practical use of sequential ATPG for model checking: going the extra mile does pay off
We present a study of the practical use of a simulationbased automatic test pattern generation (ATPG) for model checking in large sequential circuits. Preliminary findings show that ATPGs which gradually build and learn from the state-space has the potential to achieve the verification objective without needing the complete state-space information. The success of verifying a useful set of prope...
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Automatic Test Pattern Generation (ATPG) is arguably one of the practical applications that motivated the development of modern Boolean Satisfiability (SAT) solvers in the mid 90s. Despite the interest of using SAT in ATPG, the original model remained mostly unchanged for nearly two decades, even in the presence of renewed interest in applying modern SAT technology to large-scale hardware desig...
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Circuit partitioned approaches to ATPG have been developed and used over the last two decades, depending on the ratio between state-of-the-art in ATPG and circuit sizes. A practical form consists of coarse-grain, cone-oriented partitioning of the circuit. We investigated the problems introduced by practical ATPG constraints: keeping tests (3-state) bus-conflict free, and complying to external r...
متن کاملSatis ability for ATPG : Is it easy ?
It has been observed that SAT formulae derived from ATPG problems are eeciently solvable in practise. This seems counter-intuitive since SAT is known to be NP ? Complete. This work seeks to explain this paradox. We identify a certain property of circuits which facilitates eecient solution of ATPG-SAT instances arising from them. In addition, we provide both theoretical proofs and empirical evid...
متن کامل2 . 1 Why is ATPG easy ?
Empirical observation shows that practically encountered instances of ATP6 are efficiently solvable. However, it has been known for more than two decades that ATPG is an NP-complete problem. This work is one of the first attempts to reconcile these seemingly disparate results. We introduce the concept of circuit cut-width and characterize the complexity of ATPG in terms of this property. We pro...
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عنوان ژورنال:
- IEEE Design & Test of Computers
دوره 21 شماره
صفحات -
تاریخ انتشار 2004